Characterization of 8T SRAM Cells using 16 nm FinFET Technology
Coverage
InternationalType
Non-IndexedPublished
Publisher
International Conference on Signal Processing and Communication, Nodia.Cite As
Monica, M. and Chandramohan, P. (2016) Characterization of 8T SRAM Cells using 16 nm FinFET Technology, Proceedings of International Conference on Signal Processing and Communication, Nodia.