Microwave Imaging Based Damage Detection in Columns using Artificial Neural Network, International Conference on Electronics


  • Coverage

    International
  • Type

    Indexed
  • Published

  • Publisher

    Materials Engineering & Nano-Technology
  • Cite As

    Harini,V., Nayana,N.PatilandRajashekar Swamy, H.M. (2019)Microwave Imaging Based Damage Detection in Columns using Artificial Neural Network, International Conference on Electronics, Materials Engineering & Nano-Technology.